Challenges for Electron Tomography of Nanoscale Electrical Devices: Geometry and Beam Damage
نویسندگان
چکیده
منابع مشابه
Challenges in Nanoscale Devices and Breakthrough
Over the past 50 years of the semiconductor industry, the size of MOSFETs has been scaled down obeying the Moore’s law: feature sizes of transistors are scaled at a rate of approximately 0.7 times every 18 months. However, as CMOS technology approaches nanoscale region, researchers face with critical technology barrier known as short channel effect. While the gate voltage fully controls the cha...
متن کاملLow Capacitance Electrical Probe for Nanoscale Devices and Circuits
An electrical probe is constructed of a small capacitor in contact with the circuit node under test so as not to load this circuit node and cause distortion of the input signal. The small capacitor is then placed in series with the small input resistance of a terminated coaxial signal line. The voltage signal at the output of the coaxial line will be approximately the product of the small capac...
متن کاملC-reactive protein and electron beam tomography.
Beam Tomography To the Editor: The study by Park et al1 demonstrates that electron beam tomography (EBT)–derived coronary calcium scores (CCS) are incremental in predicting cardiac risk, consistent with previous data. However, the authors downplay the prognostic power of CCS and elevate the value of C-reactive protein (CRP). They state, “CRP was a marginally significant predictor of MI [myocard...
متن کاملstudy of cohesive devices in the textbook of english for the students of apsychology by rastegarpour
this study investigates the cohesive devices used in the textbook of english for the students of psychology. the research questions and hypotheses in the present study are based on what frequency and distribution of grammatical and lexical cohesive devices are. then, to answer the questions all grammatical and lexical cohesive devices in reading comprehension passages from 6 units of 21units th...
ذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611008610